000 01069nam a2200277 a 4500
001 vtls000062343
003 KUKTEM
005 20251125095905.0
008 120618t2012 nyua f 001 0 eng d
020 _a9780521762106
039 9 _a201502101438
_bariffin
_y201206181655
_zsafura
040 _aUMP
090 _aTK7871.9 .N66 2012
245 0 0 _aNonlinear transistor model parameter extraction techniques /
_cedited by Matthias Rudolph, Christian Fager, David E. Root
260 _aNew York :
_bCambridge University Press,
_c2012
300 _axiv, 352 p. :
_bill. ;
_c26 cm.
490 1 _aThe Cambridge RF and microwave engineering series
504 _aIncludes bibliographical references and index
650 0 _aTransistors
_xMathematical models
650 0 _aElectronic circuit design
700 1 _aRudolph, Matthias
700 1 _aFager, Christian
700 1 _aRoot, David E.
830 0 _aThe Cambridge RF and microwave engineering series
999 _aVIRTUA40
_c75644
_d75650
999 _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*7001*7002*8300*9992