000 01079nam a2200265 a 4500
001 vtls000078345
003 KUKTEM
005 20251125095910.0
008 140519t2012 ne f 001 0 eng d
020 _a9780123942982 (hbk.)
020 _a0123942985 (hbk.)
039 9 _a201504141232
_bsafura
_c201502231015
_dsafura
_c201502231004
_dsafura
_y201405191511
_znadia
040 _aUMP
090 _aTK7876.5 .S55 2012
245 0 0 _aSilicon-based millimeter-wave technology measurement, modeling and applications /
_cguest editor M. Jamal Deen
260 _aAmsterdam :
_bElsevier/Academic Press,
_c2012
300 _axix, 483, [15] p. plates :
_bill., col. plates. ;
_c23 cm.
490 1 _aAdvances in imaging and electron physics ;
_vv. 174
504 _aIncludes bibliographical references and index
650 0 _aMillimeter wave devices
650 0 _aSilicon crystals
700 1 _aDeen, M. Jamal
830 0 _aAdvances in imaging and electron physics ;
_vv . 174
999 _aVIRTUA40
_c75727
_d75733
999 _aVTLSSORT0080*0200*0201*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*8300*9992