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| 008 | 140603t2013 at a f 001 0 eng d | ||
| 020 | _a9780819496881 | ||
| 020 | _a081949688X | ||
| 039 | 9 |
_a201412160942 _bariffin _y201406031136 _zfauzi |
|
| 040 | _aUMP | ||
| 090 | _aTA418.9.N35 N366464 2013 | ||
| 111 | 2 |
_aOptical Manufacturing and Testing X (Conference) _n(10th : _d2013 : _cSan Diego, Calif.) |
|
| 245 | 1 | 0 |
_aOptical manufacturing and testing x : _b26-27 August 2013, San Diego, California, United States / _cOliver W. Fahnie, Ray Williamson, Dae Wook, editors ; sponsored by SPIE |
| 260 |
_aBellingham, Washington, USA : _bSPIE, _c[2013] |
||
| 300 |
_a1 v. (various pagings) : _bill. ; _c28 cm. |
||
| 490 | 0 |
_aProceedings of SPIE, _x0277-786X ; _vvolume 8838 |
|
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aNanostructured materials | |
| 700 | 1 | _aFahnie, Oliver W. | |
| 700 | 1 | _aWilliamson, Ray | |
| 700 | 1 | _aWook, Dae | |
| 710 | 2 | _aSPIE (Society) | |
| 999 |
_aVIRTUA40 _c76325 _d76331 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1110*2450*2600*3000*4900*5040*6500*7000*7001*7002*7100*9992 | ||