| 000 | 00921nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000081616 | ||
| 003 | KUKTEM | ||
| 005 | 20251125100029.0 | ||
| 008 | 140707t2003 nyu f 001 0 eng d | ||
| 020 | _a9780306472923 (hbk.) | ||
| 020 | _a0306472929 | ||
| 039 | 9 |
_a201501291558 _bsafura _y201407070917 _zfauzi |
|
| 040 | _aUMP | ||
| 090 | _aQH212.S3 S33 2003 | ||
| 245 | 0 | 0 |
_aScanning electron microscopy and x-ray microanalysis / _cJoseph I. Goldstein ... [et al.]. |
| 250 | _a3rd ed. | ||
| 260 |
_aNew York : _bKluwer Academic/Plenum Publishers, _cc2003 |
||
| 300 |
_axix, 690 p. : _bill. (some col.) ; _c26 cm. + _e1 CD-ROM (4 3/4 in.) |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 | _aScanning electron microscopy | |
| 650 | 0 | _aX-ray microanalysis | |
| 700 | 1 | _aGoldstein, Joseph | |
| 999 |
_aVIRTUA40 _c76877 _d76883 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*2450*2500*2600*3000*5040*6500*6501*7000*9992 | ||