| 000 | 00992nam a2200277 a 4500 | ||
|---|---|---|---|
| 001 | vtls000081428 | ||
| 003 | KUKTEM | ||
| 005 | 20251125100125.0 | ||
| 008 | 140618t2013 nyua f 001 0 eng d | ||
| 020 | _a9781628085914 | ||
| 039 | 9 |
_a201505261628 _bsaini _y201406180755 _zdilla |
|
| 040 | _aUMP | ||
| 090 | _aTA417.23 .X73 2013 | ||
| 245 | 0 | 0 |
_aX-ray diffraction : _bstructure, principles, and applications / _cKaimin Shih, editor |
| 260 |
_aHauppauge, N.Y. : _bNova Science, _c2013 |
||
| 300 |
_aix, 282 p. : _bill. ; _c26 cm. |
||
| 490 | 1 | _aMaterials science and technologies | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMaterials _xMicroscopy |
|
| 650 | 0 |
_aX-rays _xDiffraction |
|
| 650 | 0 | _aX-ray crystallography | |
| 650 | 0 | _aTransmission electron microscopy | |
| 700 | 1 | _aShih, Kaimin | |
| 830 | 0 | _aMaterials science and technologies | |
| 999 |
_aVIRTUA40 _c77715 _d77721 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5040*6500*6501*6502*6503*7000*8300*9992 | ||