000 01056nam a2200277 a 4500
001 vtls000084363
003 KUKTEM
005 20251125100134.0
008 141201t2014 njua f 001 0 eng d
020 _a9781613531778
039 9 _a201504171041
_bsaini
_y201412011147
_ztraining2
040 _aUMP
090 _aQC665.E4 G78 2014
100 1 _aGrudzinski, Eugeniusz
245 1 0 _aElectromagnetic field standards and exposure systems /
_cEugeniusz Grudzinski and Hubert Trzaska
260 _aEdison, NJ :
_bSciTech Pub.,
_c2014
300 _ax, 201 p. :
_bill. ;
_c24 cm.
490 1 _aSciTech series on electromagnetic compatibility
504 _aIncludes bibliographical references and index
650 0 _aElectromagnetic fields
_xMeasurement
650 0 _aElectromagnetic fields
_xMathematics
650 0 _aElectromagnetic measurements
700 1 _aTrzaska, Hubert
830 0 _aSciTech series on electromagnetic compatibility
999 _aVIRTUA40
_c77864
_d77870
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*6502*7000*8300*9992