| 000 | 00803nam a2200229 a 4500 | ||
|---|---|---|---|
| 001 | vtls000090472 | ||
| 003 | KUKTEM | ||
| 005 | 20251125100338.0 | ||
| 008 | 150728t2015 nyuda of 001 0 eng d | ||
| 020 | _a9783662452394 | ||
| 039 | 9 |
_a201601081108 _bzul _y201507281716 _zezzatul |
|
| 040 | _aUMP | ||
| 090 | _aQH212.S33 V65 2015 | ||
| 100 | 1 | _aVoigtlander, Bert | |
| 245 | 1 | 0 |
_aScanning probe microscopy : _batomic force microscopy and scanning tunneling microscopy _cBert Voigtlander |
| 260 |
_aNew York, NY : _bSpringer, _c2015 |
||
| 300 |
_axv, 382 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibiliographical references and index | ||
| 650 | 0 | _aScanning probe microscopy | |
| 650 | 0 | _aNanoelectronics | |
| 999 |
_aVIRTUA40 _c79676 _d79682 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*9992 | ||