000 00901nam a2200241 a 4500
001 vtls000093157
003 KUKTEM
005 20251125102854.0
008 151212t2015 flua f 001 0 eng d
020 _a9781439846384 (hbk.)
039 9 _a201602111426
_bsaini
_c201512141032
_dida
_c201512141031
_dida
_y201512121210
_zesuadi
040 _aUMP
090 _aQC702.7.B65 N37 2015
100 1 _aNastasi, Michael Anthony,
_d1950-
245 1 0 _aIon beam analysis :
_bfundamentals and applications /
_cMichael Nastasi, James W. Mayer, Yongqiang Wang
260 _aBoca Raton, FL :
_bCRC Press,
_c2015
300 _axxi, 450 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aIon bombardment
700 1 _aMayer, James W.,
_d1930-
700 1 _aWang, Yongqiang
999 _aVIRTUA40
_c80376
_d80382
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*7000*7001*9992