| 000 | 01008nam a2200253 a 4500 | ||
|---|---|---|---|
| 001 | vtls000085946 | ||
| 003 | KUKTEM | ||
| 005 | 20251125103040.0 | ||
| 008 | 150417t2014 gw a f 000 0 eng d | ||
| 020 | _a9783319023779 (hbk.) | ||
| 039 | 9 |
_a201509011534 _bsafura _y201504171551 _zezzatul |
|
| 040 | _aUMP | ||
| 090 | _aTK7874.893 .N65 2014 | ||
| 100 | 1 | _aNoia, Brandon | |
| 245 | 1 | 0 |
_aDesign-for-test and test optimization techniques for TSV- based 3D stacked ICs / _cBrandon Noia, Krishnendu Chakrabarty ; foreword by Vishwani Agrawal |
| 260 |
_aCham : _bSpringer, _c2014 |
||
| 300 |
_axviii, 247 p.) : _bill. (some col.) ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references | ||
| 650 | 0 |
_aThree-dimensional integrated circuits _xDesign and construction |
|
| 650 | 0 |
_aThree-dimensional integrated circuits _xTesting |
|
| 700 | 1 | _aAgrawal, Vishwani D. | |
| 700 | 1 | _aChakrabarty, Krishnendu | |
| 999 |
_aVIRTUA40 _c81796 _d81802 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*7000*7001*9992 | ||