| 000 | 00917nam a2200241 a 4500 | ||
|---|---|---|---|
| 001 | vtls000092644 | ||
| 003 | KUKTEM | ||
| 005 | 20251125103107.0 | ||
| 008 | 151203t2014 flua f 001 0 eng d | ||
| 020 | _a9781439829417 (hbk.) | ||
| 039 | 9 |
_a201601221513 _bsaini _y201512031133 _zfaiz |
|
| 040 | _aUMP | ||
| 090 | _aTK7871.99.M44 T47 2014 | ||
| 245 | 0 | 0 |
_aTesting for small-delay defects in nanoscale CMOS integrated circuits / _cedited by Sandeep K. Goel, Krishnendu Chakrabarty |
| 260 |
_aBoca Raton, FL : _bCRC Press, _c2014 |
||
| 300 |
_axv, 247 p. : _bill. ; _c24 cm. |
||
| 490 | 0 | _aDevices, circuits, and systems | |
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aMetal oxide semiconductors, Complementary _xTesting |
|
| 700 | 1 | _aGoel, Sandeep K. | |
| 700 | 1 | _aChakrabarty, Krishnendu | |
| 999 |
_aVIRTUA40 _c82150 _d82156 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5040*6500*7000*7001*9992 | ||