000 00978nam a2200265 a 4500
001 vtls000088963
003 KUKTEM
005 20251125103114.0
008 150623t2014 paua f 001 0 eng d
020 _a9781466658523 (hbk.)
020 _a1466658525
039 9 _a201905081621
_bAUTHORITY
_c201512301502
_dsafura
_y201506231506
_zazli
040 _aUMP
090 _aTA417.25 .G83 2014
100 1 _aGubicza, Jeno
245 1 0 _aX-ray line profile analysis in materials science /
_cJenő Gubicza, Eötvös Loránd University , Hungary
260 _aHershey, PA :
_bEngineering Science Reference,
_c2014
300 _axvi, 343 p. :
_bill. ;
_c26 cm.
490 0 _aResearch essentials
504 _aIncludes bibliographical references and index
650 0 _aRadiography, Industrial
650 0 _aMaterials
_xTesting
650 0 _aX-rays
_xIndustrial applications
999 _aVIRTUA40
_c82253
_d82259
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*4900*5040*6500*6501*6502*9992