000 00824nam a2200241 a 4500
001 vtls000089553
003 KUKTEM
005 20251125103126.0
008 150706t2014 nyua f 001 0 eng d
020 _a9781493909346 (hbk.)
039 9 _a201601131538
_bsaini
_y201507061327
_zazli
040 _aUMP
090 _aTA417.23 .B38 2014
100 1 _aBauer, Ernst
245 1 0 _aSurface microscopy with low energy electrons /
_cErnst Bauer
260 _aNew York, NY :
_bSpringer,
_c2014
300 _axix, 496 p. :
_bill. (some col.) ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aMaterials
_xMicroscopy
650 0 _aElectron microscopy
650 0 _aLow energy electron diffraction
999 _aVIRTUA40
_c82443
_d82449
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2600*3000*5040*6500*6501*6502*9992