| 000 | 00758nam a2200217 a 4500 | ||
|---|---|---|---|
| 001 | vtls000093731 | ||
| 003 | KUKTEM | ||
| 005 | 20251125103230.0 | ||
| 008 | 160310t2012 enka f 000 0 eng | ||
| 020 | _a9789535105763 | ||
| 039 | 9 |
_a201606211139 _bhuda _y201603101002 _zepul |
|
| 040 | _aUMP | ||
| 090 | _aQH212.S33 S33 2012 | ||
| 245 | 0 | 0 |
_aScanning probe microscopy : _bphysical property characterization at nanoscale / _cedited by Vijay Nalladega |
| 260 |
_aCroatia : _bINTECH, _c2012 |
||
| 300 |
_avi, 242 p. : _bill. (some col.) ; _c23 cm. |
||
| 500 | _aIncludes bibliographical references | ||
| 650 | 0 | _aScanning probe microscopy | |
| 700 | 1 | _aNalladega, Vijay | |
| 999 |
_aVIRTUA40 _c83489 _d83495 |
||
| 999 | _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*5000*6500*7000*9992 | ||