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|---|---|---|---|
| 001 | vtls000099801 | ||
| 003 | KUKTEM | ||
| 005 | 20251125103440.0 | ||
| 008 | 170503t2016 maua f 001 0 eng d | ||
| 020 | _a9781608079858 (hbk.) | ||
| 020 | _a1608079856 (hbk.) | ||
| 039 | 9 |
_a201904301306 _bAUTHORITY _c201707210920 _dfateeha _c201707031144 _dfateeha _y201705031016 _zfaiz |
|
| 040 | _aUMP | ||
| 090 | _aTK7874.58 .M67 2016 | ||
| 100 | 1 | _aMoreira, Jose | |
| 245 | 1 | 3 |
_aAn engineer's guide to automated testing of high-speed interfaces / _cJosé Moreira and Hubert Werkmann |
| 250 | _a2nd ed. | ||
| 260 |
_aNorwood, MA : _bArtech House Publishers, _c2016 |
||
| 300 |
_axxiv, 677 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references and index | ||
| 650 | 0 |
_aIntegrated circuits _xTesting |
|
| 650 | 0 | _aAutomatic test equipment | |
| 650 | 0 | _aVery high speed integrated circuits | |
| 700 | 1 | _aWerkmann, Hubert | |
| 999 |
_aVIRTUA40 _c85432 _d85438 |
||
| 999 | _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2500*2600*3000*5040*6500*6501*6502*7000*9992 | ||