000 00885nam a2200253 a 4500
001 vtls000096544
003 KUKTEM
005 20251125103523.0
008 160623t2016 njua f 001 0 eng d
020 _a9781771882989 (hbk.)
020 _a1771882980
039 9 _a201609091021
_bsafura
_y201606231318
_zazli
040 _aUMP
090 _aQC482.D5 L44 2016
100 1 _aLee, Myeongkyu
245 1 0 _aX-ray diffraction for materials research :
_bfrom fundamentals to applications /
_cMyeongkyu Lee
260 _aOakville, ON, Canada ;
_aWaretown, NJ, USA :
_bApple Academic Press,
_c2016
300 _axii, 289 p. :
_bill. ;
_c24 cm.
504 _aIncludes bibliographical references and index
650 0 _aX-rays
_xDiffraction
650 0 _aMaterials
_xResearch
999 _aVIRTUA40
_c86087
_d86093
999 _aVTLSSORT0080*0200*0201*0400*0900*1000*2450*2600*3000*5040*6500*6501*9992
942 0 0 _01