000 00967nam a2200253 a 4500
001 vtls000099735
003 KUKTEM
005 20251125103554.0
008 170502t2017 gw a f 001 0 eng d
020 _a9783527340392 (hbk.)
039 9 _a201706161053
_bsaini
_y201705021503
_zepul
040 _aUMP
090 _aT174.7 .M48 2017
245 0 0 _aMetrology and standardization for nanotechnology :
_bprotocols and industrial innovations /
_cedited by Elisabeth Mansfield ... [at al.]
260 _aWeinheim, Germany :
_bWiley-VCH,
_c2017
300 _axxxii, 594 p. :
_bill. (some col.) ;
_c25 cm.
490 1 _aNanotechnology innovation & applications
504 _aIncludes bibliographical references and index
650 0 _aNanotechnology
650 0 _aMetrology
700 1 _aMansfield, Elisabeth
830 0 _aNanotechnology innovation & applications
999 _aVIRTUA40
_c86471
_d86477
999 _aVTLSSORT0080*0200*0400*0900*2450*2600*3000*4900*5040*6500*6501*7000*8300*9992