000 01081nam a2200289 i 4500
001 vtls000102029
003 KUKTEM
005 20251125103659.0
008 171019s2017 dk da f 001 0 eng
020 _a9788793379756
_qhardback
039 9 _a201801301653
_bhuda
_c201801181224
_dhuda
_y201710191209
_zfaiz
040 _aUMP
_beng
_cUMP
_erda
090 _aTK7867 .W43 2017
100 1 _aWeber, Stephan,
_eauthor.
245 1 0 _aCircuit design :
_banticipate, analyze, exploit variations /
_cStephan Weber, Candido Duarte
246 3 _aStatistical methods and optimization
264 1 _aDenmark :
_bRiver Publishers,
_c2017
264 4 _c© 2017
300 _aLIX, 575 pages :
_billustration (some color) ;
_c24 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
504 _aIncludes bibliographical references and index
650 0 _aElectronic circuit design
700 1 _aDuarte, Candido,
_eauthor.
999 _aVIRTUA40
_c87566
_d87572
999 _aVTLSSORT0080*0200*0400*0900*1000*2450*2460*2640*2641*3000*3360*3370*3380*5040*6500*7000*9992