000 01243nam a2200301 a 4500
001 vtls000104833
003 KUKTEM
005 20251125103810.0
008 180809t20172017nyua f 001 0 eng d
020 _a9781138898363
_qhardback
039 9 _a201811011530
_bzul
_y201808091414
_zepul
040 _aUMP
_beng
_cUMP
_erda
090 _aLB3060.8 .V35 2017
245 0 0 _aValidation of score meaning for the next generation of assessments :
_bthe use of response processes /
_cedited by Kadriye Ercikan and James W. Pellegrino
264 1 _aNew York, N.Y. :
_bRoutledge,
_c2017
264 4 _c© 2017
300 _aviii, 155 pages :
_billustrations ;
_c26 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
490 0 _aNCME applications of educational measurement and assessment book series
504 _aIncludes bibliographical references and index
650 0 _aExaminations
_xInterpretation
650 0 _aEducational tests and measurements
_xStandards
_zUnited States
700 1 _aErcikan, Kadriye,
_eeditor.
700 1 _aPellegrino, James W., œe editor.
999 _aVIRTUA40
_c88681
_d88687
999 _aVTLSSORT0080*0200*0400*0900*2450*2640*2641*3000*3360*3370*3380*4900*5040*6500*6501*7000*7001*9992