000 01218nam a2200325 i 4500
001 vtls000104565
003 KUKTEM
005 20251125103941.0
008 180730t20182018ne a f 001 0 eng d
020 _a9780128111666
_qpaperback
039 9 _a201808131204
_bnazri
_y201807301116
_zepul
040 _aUMP
_beng
_cUMP
_erda
090 _aTA418.9.T45 M48 2018
245 0 0 _aMetal oxide-based thin film structures :
_bformation, characterization and application of interface-based phenomena /
_cedited by Nini Pryds and Vincenzo Esposito
264 1 _aAmsterdam :
_bElsevier,
_c2018
264 4 _c© 2018
300 _axxiv, 536 pages :
_billustrations ;
_c23 cm.
336 _atext
_2rdacontent
337 _aunmediated
_2rdamedia
338 _avolume
_2rdacarrier
490 1 _aMetal oxides series
504 _aIncludes bibliographical references and index
650 0 _aThin films
650 0 _aMetallic oxides
650 0 _aInterfaces (Physical sciences)
700 1 _aPryds, Nini,
_eeditor.
700 1 _aEsposito, Vincenzo,
_eeditor.
830 0 _aMetal oxides series
999 _aVIRTUA40
_c89845
_d89851
999 _aVTLSSORT0080*0200*0400*0900*2450*2640*2641*3000*3360*3370*3380*4900*5040*6500*6501*6502*7000*7001*8300*9992