000 00997nam a2200289 i 4500
999 _c93907
_d93913
003 MY-KuUP
005 20251125105711.0
006 a||||fs|||| 00| 0
007 cr |||||||||||
008 191005s2020 sz fr 001 0 eng d
020 _a9783030237813
_qebook
040 _aOhioLINK
_beng
_cUMP
_erda
090 _aTA7874 .A34 2020
245 0 0 _aAgeing of integrated circuits :
_bcauses, effects and mitigation techniques /
_cBasek Halak, editor
264 1 _aCham :
_bSpringer,
_c2020
264 4 _c© 2020
300 _a1 online resource
336 _atext
_2rdacontent
337 _acomputer
_2rdamedia
338 _aonline resource
_2rdacarrier
500 _aIncludes index
650 0 _aIntegrated circuits
700 1 _aHalak, Basel,
_eeditor.
856 4 0 _uhttps://link-springer-com.libraryumpsa.idm.oclc.org/search?query=978-3-030-23781-3
_zOff-Campus link
856 4 0 _uhttps://link.springer.com/book/10.1007/978-3-030-23781-3
_zClick here (Direct link)
942 _2lcc
_cEBOOK