Defect and microstructure analysis by diffraction /
Defect and microstructure analysis by diffraction /
[edited by] Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge
- Oxford; New York: Oxford University Press, 1999
- xxii, 785 p.: ill.; 24 cm.
- International Union of Crystallography monographs on crystallography; 10 .
Includes bibliographical references and index
0198501897
Crystals--Defects--Analysis
Diffraction
X-ray crystallography
Includes bibliographical references and index
0198501897
Crystals--Defects--Analysis
Diffraction
X-ray crystallography