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Defect and microstructure analysis by diffraction / [edited by] Robert L. Snyder, Jaroslav Fiala, Hans J. Bunge
Material type:
TextSeries: International Union of Crystallography monographs on crystallography; 10Publication details: Oxford; New York: Oxford University Press, 1999Description: xxii, 785 p.: ill.; 24 cmISBN: - 0198501897
- Snyder, Robert L
- Fiala, Jaroslav
- Bunge, Hans J
| Item type | Current library | Call number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|
Open Shelf
|
UMPLIB GAMBANG | QD945 .D43 1999 (Browse shelf(Opens below)) | Available | 0000009438 |
Includes bibliographical references and index