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Value analysis tear-down : a new process for product development and innovation /

Sato, Yoshihiko

Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman - New York: Industrial Press, 2005 - x, 206 p.: ill.; 24 cm.

Includes bibliographical references and index.

ISBN: 0831132035

Subjects--Topical Terms:
Value analysis (Cost control)
Industrial productivity
New products
Engineering economy

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