Value analysis tear-down : a new process for product development and innovation / Yoshihiko Sato and J. Jerry Kaufman

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Material type: Text

TextPublication details: New York: Industrial Press, 2005Description: x, 206 p.: ill.; 24 cmISBN:

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Holdings
Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	Non-fiction	HD47.3 .S27 2005 (Browse shelf(Opens below))	1	Available		0000014220

Includes bibliographical references and index.