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Emerging nanotechnologies : test, defect tolerance, and reliability /

Emerging nanotechnologies : test, defect tolerance, and reliability / [edited by] Mohammad Tehranipoor - New York : Springer , 2008 - xii, 405 p. : ill. ; 25 cm. - Frontiers in electronic testing ; v. 37 .

Includes index

ISBN: 9780387747460

Subjects--Topical Terms:
Nanotechnology

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