Emerging nanotechnologies : test, defect tolerance, and reliability / [edited by] Mohammad Tehranipoor

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Material type: Text

TextSeries: Frontiers in electronic testing ; v. 37Publication details: New York : Springer , 2008Description: xii, 405 p. : ill. ; 25 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	T174.7 .E44 2008 (Browse shelf(Opens below))	1	Available		0000033776

Includes index