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Power-aware testing and test strategies for low power devices /

Power-aware testing and test strategies for low power devices / Patrick Girard, Nicola Nicolici, Xiaoqing Wen, editors - New York : Springer, 2010 - xxiii, 363 p. : ill. ; 24 cm.

Includes bibliographical references and index

ISBN: 9781441909275 1441909273

Subjects--Topical Terms:
Low voltage integrated circuits--Power supply
Low voltage integrated circuits--Testing

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