Power-aware testing and test strategies for low power devices / Patrick Girard, Nicola Nicolici, Xiaoqing Wen, editors

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Material type: Text

TextPublication details: New York : Springer, 2010Description: xxiii, 363 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7874 .P69 2010 (Browse shelf(Opens below))	1	Available		0000058552

Includes bibliographical references and index