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In-situ electron microscopy at high resolution /

In-situ electron microscopy at high resolution / editor, Florian Banhart - Singapore ; Hackensack, NJ : World Scientific, c2008 - vi, 311 p. : ill. (some col.) ; 24 cm.

Includes bibliographical references and index

ISBN: 9789812797339 9812797335

Subjects--Topical Terms:
Electron microscopy--Technique
High resolution electron microscopy

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