In-situ electron microscopy at high resolution / editor, Florian Banhart

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Material type: Text

TextPublication details: Singapore ; Hackensack, NJ : World Scientific, c2008Description: vi, 311 p. : ill. (some col.) ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	QH212.E4 I52 2008 (Browse shelf(Opens below))	1	Available		0000041387

Includes bibliographical references and index