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Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. /

Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / editors, M. Selim Unlu ... [et al.] - Warrendale, PA : Materials Research Society, 2000 - xi, 333 p. : ill. ; 24 cm. - Materials Research Society symposium proceedings ; v. 588 . - Materials Research Society symposium proceedings ; v. 588 .

Includes bibliographical references and indexes

ISBN: 9781558994966 1558994963

Subjects--Topical Terms:
Semiconductors--Congresses
Microstructure--Congresses

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