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Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / editors, M. Selim Unlu ... [et al.]
Material type:
TextSeries: Materials Research Society symposium proceedings ; v. 588Publication details: Warrendale, PA : Materials Research Society, 2000Description: xi, 333 p. : ill. ; 24 cmISBN: - 9781558994966
- 1558994963
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
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UMPLIB GAMBANG | QC610.9 .O68 2000 (Browse shelf(Opens below)) | 1 | Available | 0000073302 |
Includes bibliographical references and indexes