Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /
Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. /
editors, Mikhail R. Baklanov ... [et al.]
- New York : Cambridge University Press, 2012
- ix, 127 p. : ill. ; 24 cm.
- Materials Research Society symposium proceedings ; v. 1335 .
- Materials Research Society symposia proceedings ; v. 1335 .
Includes bibliographical references and indexes
9781605113128 1605113123
Interconnects (Integrated circuit technology)--Very large scale integration--Congressesv Congresses
Microelectronics--Congresses
Nanoelectronics--Congresses
Materials--Congresses
Includes bibliographical references and indexes
9781605113128 1605113123
Interconnects (Integrated circuit technology)--Very large scale integration--Congressesv Congresses
Microelectronics--Congresses
Nanoelectronics--Congresses
Materials--Congresses