Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A. / editors, Mikhail R. Baklanov ... [et al.]

By:

Contributor(s):

Material type: Text

TextSeries: Materials Research Society symposia proceedings ; v. 1335Publication details: New York : Cambridge University Press, 2012Description: ix, 127 p. : ill. ; 24 cmISBN:

Subject(s):

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7874.53 .S96 2012 (Browse shelf(Opens below))	1	Available		0000071727

Includes bibliographical references and indexes