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Silicon-based millimeter-wave technology measurement, modeling and applications /

Silicon-based millimeter-wave technology measurement, modeling and applications / guest editor M. Jamal Deen - Amsterdam : Elsevier/Academic Press, 2012 - xix, 483, [15] p. plates : ill., col. plates. ; 23 cm. - Advances in imaging and electron physics ; v. 174 . - Advances in imaging and electron physics ; v . 174 .

Includes bibliographical references and index

ISBN: 9780123942982 (hbk.) 0123942985 (hbk.)

Subjects--Topical Terms:
Millimeter wave devices
Silicon crystals

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