Silicon-based millimeter-wave technology measurement, modeling and applications / guest editor M. Jamal Deen

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Material type: Text

TextSeries: Advances in imaging and electron physics ; v . 174Publication details: Amsterdam : Elsevier/Academic Press, 2012Description: xix, 483, [15] p. plates : ill., col. plates. ; 23 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7876.5 .S55 2012 (Browse shelf(Opens below))	1	Available		0000090713

Includes bibliographical references and index