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Scanning electron microscopy and x-ray microanalysis /

Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.]. - 3rd ed. - New York : Kluwer Academic/Plenum Publishers, c2003 - xix, 690 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)

Includes bibliographical references and index

ISBN: 9780306472923 (hbk.) 0306472929

Subjects--Topical Terms:
Scanning electron microscopy
X-ray microanalysis

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