Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].

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Material type: Text

TextPublication details: New York : Kluwer Academic/Plenum Publishers, c2003Edition: 3rd edDescription: xix, 690 p. : ill. (some col.) ; 26 cm. + 1 CD-ROM (4 3/4 in.)ISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	QH212.S3 S33 2003 (Browse shelf(Opens below))	1	Available		0000091235
Accompanying Material	UMPLIB GAMBANG	CD 8500 \| QH212.S3 S33 2003 (Browse shelf(Opens below))	1	Available		0000091236

Includes bibliographical references and index