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X-ray diffraction : structure, principles, and applications /

X-ray diffraction : structure, principles, and applications / Kaimin Shih, editor - Hauppauge, N.Y. : Nova Science, 2013 - ix, 282 p. : ill. ; 26 cm. - Materials science and technologies . - Materials science and technologies .

Includes bibliographical references and index

ISBN: 9781628085914

Subjects--Topical Terms:
Materials--Microscopy
X-rays--Diffraction
X-ray crystallography
Transmission electron microscopy

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