X-ray diffraction : structure, principles, and applications / Kaimin Shih, editor

Contributor(s):

Material type: Text

TextSeries: Materials science and technologiesPublication details: Hauppauge, N.Y. : Nova Science, 2013Description: ix, 282 p. : ill. ; 26 cmISBN:

Subject(s):

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	TA417.23 .X73 2013 (Browse shelf(Opens below))	1	Available		0000096809

Includes bibliographical references and index