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Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy

Voigtlander, Bert

Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy Bert Voigtlander - New York, NY : Springer, 2015 - xv, 382 p. : ill. ; 24 cm.

Includes bibiliographical references and index

ISBN: 9783662452394

Subjects--Topical Terms:
Scanning probe microscopy
Nanoelectronics

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