Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy Bert Voigtlander

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Material type: Text

TextPublication details: New York, NY : Springer, 2015Description: xv, 382 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	QH212.S33 V65 2015 (Browse shelf(Opens below))	1	Available		0000106220

Includes bibiliographical references and index