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Testing for small-delay defects in nanoscale CMOS integrated circuits /

Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty - Boca Raton, FL : CRC Press, 2014 - xv, 247 p. : ill. ; 24 cm. - Devices, circuits, and systems .

Includes bibliographical references and index

ISBN: 9781439829417 (hbk.)

Subjects--Topical Terms:
Metal oxide semiconductors, Complementary--Testing

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