Testing for small-delay defects in nanoscale CMOS integrated circuits / edited by Sandeep K. Goel, Krishnendu Chakrabarty

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Material type: Text

TextSeries: Devices, circuits, and systemsPublication details: Boca Raton, FL : CRC Press, 2014Description: xv, 247 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7871.99.M44 T47 2014 (Browse shelf(Opens below))	1	Available		0000106643

Includes bibliographical references and index