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Scanning probe microscopy : physical property characterization at nanoscale /

Scanning probe microscopy : physical property characterization at nanoscale / edited by Vijay Nalladega - Croatia : INTECH, 2012 - vi, 242 p. : ill. (some col.) ; 23 cm.

Includes bibliographical references

ISBN: 9789535105763

Subjects--Topical Terms:
Scanning probe microscopy

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