Scanning probe microscopy : physical property characterization at nanoscale / edited by Vijay Nalladega

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Material type: Text

TextPublication details: Croatia : INTECH, 2012Description: vi, 242 p. : ill. (some col.) ; 23 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB GAMBANG	QH212.S33 S33 2012 (Browse shelf(Opens below))	1	Available		0000110234

Includes bibliographical references