Test and diagnosis of analogue, mixed-signal and RF integrated circuits : (Record no. 43179)

MARC details
000 -LEADER
fixed length control field 00998nam a2200241 a 4500
001 - CONTROL NUMBER
control field vtls000034199
003 - CONTROL NUMBER IDENTIFIER
control field KUKTEM
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20251117145304.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 090128t2008 xxka f 001 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9780863417450
039 #9 - LEVEL OF BIBLIOGRAPHIC CONTROL AND CODING DETAIL [OBSOLETE]
Level of rules in bibliographic description 201107132107
Level of effort used to assign nonsubject heading access points VLOAD
Level of effort used to assign subject headings 200908271254
Level of effort used to assign classification kam
Level of effort used to assign subject headings 200908191226
Level of effort used to assign classification fauzi
Level of effort used to assign subject headings 200908141645
Level of effort used to assign classification fauzi
-- 200901281422
-- saini
040 ## - CATALOGING SOURCE
Original cataloging agency UMP
090 ## - LOCALLY ASSIGNED LC-TYPE CALL NUMBER (OCLC); LOCAL CALL NUMBER (RLIN)
Classification number (OCLC) (R) ; Classification number, CALL (RLIN) (NR) TK7874.654 .T47 2008
245 00 - TITLE STATEMENT
Title Test and diagnosis of analogue, mixed-signal and RF integrated circuits :
Remainder of title the system on chip approach /
Statement of responsibility, etc. edited by Yichuang Sun
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. London :
Name of publisher, distributor, etc. Institution of Engineering and Technology ,
Date of publication, distribution, etc. 2008
300 ## - PHYSICAL DESCRIPTION
Extent 389 p. :
Other physical details ill. ;
Dimensions 24 cm.
490 1# - SERIES STATEMENT
Series statement Circuits, devices and systems series ;
Volume/sequential designation 19
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Linear integrated circuits
General subdivision Testing
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Mixed signal circuits
General subdivision Testing
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Radio frequency integrated circuits
General subdivision Testing
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Sun, Yichuang
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Cost, normal purchase price Total checkouts Full call number Barcode Date last seen Copy number Cost, replacement price Price effective from Koha item type
  Not lost     UMPLIB PEKAN UMPLIB PEKAN 04/09/2019 301.13   TK7874.654 .T47 2008 0000039114 04/09/2019 1 301.13 04/09/2019 Open Shelf

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