Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach / edited by Yichuang Sun

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Material type: Text

TextSeries: Publication details: London : Institution of Engineering and Technology , 2008Description: 389 p. : ill. ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7874.654 .T47 2008 (Browse shelf(Opens below))	1	Available		0000039114