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Gettering and defect engineering in semiconductor technology XIV : selected papers from the 14th International Biannual Meeting on Gettering and Defect Engineering in Semiconductor, (GADEST2011) : September 25-30, 2011, Loipersdorf (Furstenfeld), Austria) / edited by W. Jantsch, F. Schaffler
Material type:
TextSeries: Solid state phenomena ; v. 178Publication details: Durnten-Zuerich, Switzerland : TTP, c2011Description: xii, 520 p. : ill. ; 25 cmISBN: - 9783037852323
- Gettering and defect engineering in semiconductor technology 14
- GADEST 2011
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
Open Shelf
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UMPLIB PEKAN | TK7871.85 .G33 2011 (Browse shelf(Opens below)) | 1 | Available | 0000080652 |
Includes bibliographical references and index