Design-for-test and test optimization techniques for TSV- based 3D stacked ICs / Brandon Noia, Krishnendu Chakrabarty ; foreword by Vishwani Agrawal

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Material type: Text

TextPublication details: Cham : Springer, 2014Description: xviii, 247 p.) : ill. (some col.) ; 24 cmISBN:

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Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Open Shelf	UMPLIB PEKAN	TK7874.893 .N65 2014 (Browse shelf(Opens below))	1	Available		0000100394

Includes bibliographical references